科技部整合型計畫 - Test for Zero Project
(Nov. 1, 2019 - Oct. 31, 2022)
【Primary Investigators】
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李淑敏 Katherine
Lee,
National Sun
Yat-Sen
University(NSYSU) Topics of Research (Sub-Project 1) : Novel TestDNA Wafer Defect Signature for Diagnosis and Yield Improvement in Smart Manufacturing AI-Inside Automotive Chips |
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溫宏斌 Charles Wen,
National Chiao
Tung University(NCTU) Topics of Research (Sub-Project 2): Data-oriented Modeling of Soft-Error-Rate Analysis and Mechanism of Online Aging Monitoring |
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黃錫瑜 Shi‐Yu Huang,
National Tsing Hua
University(NTHU) Topics of Research (Sub-Project 3) : Online Safety Hazards and Aging Detection for High-Performance Logic Circuits |
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黃宗柱
Tsung-Chu Huang,
National
Changhua University
of Education(NCUE)
Topics of Research (Sub-Project 4): Big-Data Driven Online Testing, Reconfiguration, and Reliability Enhancement for AI Hard-ware Accelerators |