Time: 13:30-16:40pm, Nov. 30 (Friday), 2018
Venue: 清大台達館 919 會議室
Agenda |
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| Time | Title |
| 12:00 ‐ 13:30 | 午餐餐敘 @ 清大名人堂 (after 早上的產學策略座談會) |
| 13:30 - 15:00 | Session 1: Two Research Talks ♦ “ECC‐based refresh power reduction technique for the DRAM in DNN Systems” – (進福) ♦ “A No-Reference Error-Tolerability Test Methodology for Image Processing Applications” – (東佑) |
| 15:00 - 15:30 | Coffee Break |
| 15:30 – 16:30 | Session 2: One Research Talk + 行政事項討論 ♦ “Scan Chain Diagnosis using Neural Networks” – (錫瑜) ♦ VLSI Test Technology Forum (VTTF) 討論（東佑） ♦ 2019 VLSI Test Technology Workshop (VTTW) 討論（宏斌） |
| 16:30 - 16:40 | 拍團體照 |
| 16:40 | 晚餐餐盒， 賦歸 |